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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/DufazaI96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Dufaza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassan_Ihs>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00137569>
foaf:homepage <https://doi.org/10.1007/BF00137569>
dc:identifier DBLP journals/et/DufazaI96 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00137569 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A BIST-DFT technique for DC test of analog modules. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Dufaza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassan_Ihs>
swrc:number 1-2 (xsd:string)
swrc:pages 117-133 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/DufazaI96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/DufazaI96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et9.html#DufazaI96>
rdfs:seeAlso <https://doi.org/10.1007/BF00137569>
dc:subject analog BIST; Built-In Self Test; Design For Testability; current and voltage self-testing; Built-In Voltage Sensor (xsd:string)
dc:title A BIST-DFT technique for DC test of analog modules. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 9 (xsd:string)