Using At-Speed BIST to Test LVDS Serializer/Deserializer Function.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/EckersandFF02
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2002
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Using At-Speed BIST to Test LVDS Serializer/Deserializer Function.
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2
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171-177
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LVDS; differential; BIST; At-speed
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Using At-Speed BIST to Test LVDS Serializer/Deserializer Function.
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