Fault simulation for general FCMOS ICs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/FavalliORS91
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/FavalliORS91
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fabio_Somenzi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2FBF00133502
>
foaf:
homepage
<
https://doi.org/10.1007/BF00133502
>
dc:
identifier
DBLP journals/et/FavalliORS91
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2FBF00133502
(xsd:string)
dcterms:
issued
1991
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
Fault simulation for general FCMOS ICs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bruno_Ricc%E2%88%9A%E2%89%A4
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fabio_Somenzi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michele_Favalli
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Piero_Olivo
>
swrc:
number
2
(xsd:string)
swrc:
pages
181-190
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/FavalliORS91/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/FavalliORS91
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et2.html#FavalliORS91
>
rdfs:
seeAlso
<
https://doi.org/10.1007/BF00133502
>
dc:
subject
bridging faults; CMOS circuits; critical path analysis; fault simulation; stuck-open faults
(xsd:string)
dc:
title
Fault simulation for general FCMOS ICs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
2
(xsd:string)