Low Cost BIST for Static and Dynamic Testing of ADCs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/FloresNCSCB05
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2005
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Low Cost BIST for Static and Dynamic Testing of ADCs.
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283-290
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mixed-signal test; ADC BIST; noise based testing
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Low Cost BIST for Static and Dynamic Testing of ADCs.
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