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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/GianiSHA02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ashish_Giani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_S._Hsiao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuo_Sheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1013780023643>
foaf:homepage <https://doi.org/10.1023/A:1013780023643>
dc:identifier DBLP journals/et/GianiSHA02 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1013780023643 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label State and Fault Information for Compaction-Based Test Generation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ashish_Giani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_S._Hsiao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuo_Sheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:number 1 (xsd:string)
swrc:pages 63-72 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/GianiSHA02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/GianiSHA02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et18.html#GianiSHA02>
rdfs:seeAlso <https://doi.org/10.1023/A:1013780023643>
dc:subject ATPG; sequential circuits; test compaction (xsd:string)
dc:title State and Fault Information for Compaction-Based Test Generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)