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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/GomezGC08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alejandro_Gir%E2%88%9A%E2%89%A5n>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberto_G%E2%88%9A%E2%89%A5mez_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-008-5085-z>
foaf:homepage <https://doi.org/10.1007/s10836-008-5085-z>
dc:identifier DBLP journals/et/GomezGC08 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-008-5085-z (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alejandro_Gir%E2%88%9A%E2%89%A5n>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberto_G%E2%88%9A%E2%89%A5mez_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
swrc:number 6 (xsd:string)
swrc:pages 529-538 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/GomezGC08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/GomezGC08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et24.html#GomezGC08>
rdfs:seeAlso <https://doi.org/10.1007/s10836-008-5085-z>
dc:subject Interconnection opens; Coupling capacitances; Boolean testing; Favorable logic conditions; Test generation methodology (xsd:string)
dc:title A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)