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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/GongCLDW08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fang_Liu_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kui_Dai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Gong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Chen_0009>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiying_Wang_0003>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5029-z>
foaf:homepage <https://doi.org/10.1007/s10836-007-5029-z>
dc:identifier DBLP journals/et/GongCLDW08 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5029-z (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fang_Liu_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kui_Dai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Gong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Chen_0009>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiying_Wang_0003>
swrc:number 1-3 (xsd:string)
swrc:pages 57-65 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/GongCLDW08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/GongCLDW08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et24.html#GongCLDW08>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5029-z>
dc:subject SEE tolerance; Asynchronous circuit; SEU tolerance; SET tolerance (xsd:string)
dc:title A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)