[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/GranhaugA08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kristian_Granhaug>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Snorre_Aunet>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5027-1>
foaf:homepage <https://doi.org/10.1007/s10836-007-5027-1>
dc:identifier DBLP journals/et/GranhaugA08 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5027-1 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kristian_Granhaug>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Snorre_Aunet>
swrc:number 1-3 (xsd:string)
swrc:pages 157-163 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/GranhaugA08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/GranhaugA08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et24.html#GranhaugA08>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5027-1>
dc:subject Subthreshold CMOS; Output-wired redundancy; Yield and defect tolerance (xsd:string)
dc:title Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)