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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/HaehnK97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_Haehn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._S._Kalkur>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008222607359>
foaf:homepage <https://doi.org/10.1023/A:1008222607359>
dc:identifier DBLP journals/et/HaehnK97 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008222607359 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Failure Analysis of VLSI by IDDQ Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_Haehn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._S._Kalkur>
swrc:number 3 (xsd:string)
swrc:pages 273-283 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/HaehnK97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/HaehnK97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et11.html#HaehnK97>
rdfs:seeAlso <https://doi.org/10.1023/A:1008222607359>
dc:subject failure analysis; fault diagnosis; quiescent current measurement; scanning electron microscope (xsd:string)
dc:title Failure Analysis of VLSI by IDDQ Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)