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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/HamdiouiG00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008320716847>
foaf:homepage <https://doi.org/10.1023/A:1008320716847>
dc:identifier DBLP journals/et/HamdiouiG00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008320716847 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
swrc:number 5 (xsd:string)
swrc:pages 487-498 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/HamdiouiG00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/HamdiouiG00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#HamdiouiG00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008320716847>
dc:subject multi-port memories; single-port memories; fault models; address decoder faults; march tests; fault coverage; read-only ports; write-only ports (xsd:string)
dc:title Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)