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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/HamzaogluP99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ilker_Hamzaoglu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008355411566>
foaf:homepage <https://doi.org/10.1023/A:1008355411566>
dc:identifier DBLP journals/et/HamzaogluP99 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008355411566 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label New Techniques for Deterministic Test Pattern Generation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ilker_Hamzaoglu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
swrc:number 1-2 (xsd:string)
swrc:pages 63-73 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/HamzaogluP99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/HamzaogluP99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et15.html#HamzaogluP99>
rdfs:seeAlso <https://doi.org/10.1023/A:1008355411566>
dc:subject automatic test generation; stuck-at fault; redundancy; scan design; logic implications; Boolean satisfiability (xsd:string)
dc:title New Techniques for Deterministic Test Pattern Generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 15 (xsd:string)