Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/InoueGF02
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2002
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Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption.
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55-62
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test generation; combinational circuit; sequential circuit; balanced structure; internally balanced structure
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Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption.
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