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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/JorgensonW97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joel_A._Jorgenson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Russell_J._Wagner>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008278700000>
foaf:homepage <https://doi.org/10.1023/A:1008278700000>
dc:identifier DBLP journals/et/JorgensonW97 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008278700000 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Design-For-Test in a Multiple Substrate Multichip Module. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joel_A._Jorgenson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Russell_J._Wagner>
swrc:number 1-2 (xsd:string)
swrc:pages 97-107 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/JorgensonW97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/JorgensonW97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et10.html#JorgensonW97>
rdfs:seeAlso <https://doi.org/10.1023/A:1008278700000>
dc:subject Multichip Module (MCM) Test; Known-Good Die (KGD); boundary-scan; Built-In-Self-Test (BIST); Ball Grid Array (BGA) (xsd:string)
dc:title Design-For-Test in a Multiple Substrate Multichip Module. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 10 (xsd:string)