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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/KaramS93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gabriele_Saucier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Margot_Karam>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00971938>
foaf:homepage <https://doi.org/10.1007/BF00971938>
dc:identifier DBLP journals/et/KaramS93 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00971938 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Functional versus random test generation for sequential circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gabriele_Saucier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Margot_Karam>
swrc:number 1 (xsd:string)
swrc:pages 33-41 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/KaramS93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/KaramS93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et4.html#KaramS93>
rdfs:seeAlso <https://doi.org/10.1007/BF00971938>
dc:subject Finite state machine; functional testing; graph traversal; simulation (xsd:string)
dc:title Functional versus random test generation for sequential circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)