Functional versus random test generation for sequential circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/KaramS93
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DBLP journals/et/KaramS93
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1993
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Functional versus random test generation for sequential circuits.
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Finite state machine; functional testing; graph traversal; simulation
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Functional versus random test generation for sequential circuits.
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