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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/KarpovskyY96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vyacheslav_N._Yarmolik>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00134690>
foaf:homepage <https://doi.org/10.1007/BF00134690>
dc:identifier DBLP journals/et/KarpovskyY96 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00134690 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Transparent random access memory testing for pattern sensitive faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vyacheslav_N._Yarmolik>
swrc:number 3 (xsd:string)
swrc:pages 251-266 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/KarpovskyY96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/KarpovskyY96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et9.html#KarpovskyY96>
rdfs:seeAlso <https://doi.org/10.1007/BF00134690>
dc:subject random access memory; memory testing; transparent memory testing; built-in self-test; pseudoexhaustive memory testing; pattern sensitive faults; signature analysis (xsd:string)
dc:title Transparent random access memory testing for pattern sensitive faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 9 (xsd:string)