[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/KeutnerT95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erwin_Trischler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Konstantin_Keutner>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00993129>
foaf:homepage <https://doi.org/10.1007/BF00993129>
dc:identifier DBLP journals/et/KeutnerT95 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00993129 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erwin_Trischler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Konstantin_Keutner>
swrc:number 1 (xsd:string)
swrc:pages 45-58 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/KeutnerT95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/KeutnerT95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et6.html#KeutnerT95>
rdfs:seeAlso <https://doi.org/10.1007/BF00993129>
dc:subject Modular testing; multi-bit-path sensitization; test pattern assembly (xsd:string)
dc:title Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)