[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/KunzmannB94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arno_Kunzmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_B%E2%88%9A%E2%88%82hland>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00972090>
foaf:homepage <https://doi.org/10.1007/BF00972090>
dc:identifier DBLP journals/et/KunzmannB94 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00972090 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Self-test of sequential circuits with deterministic test pattern sequences. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arno_Kunzmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_B%E2%88%9A%E2%88%82hland>
swrc:number 2-3 (xsd:string)
swrc:pages 307-312 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/KunzmannB94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/KunzmannB94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et5.html#KunzmannB94>
rdfs:seeAlso <https://doi.org/10.1007/BF00972090>
dc:subject Automatic Test Pattern Generation (ATPG); Design-for-Testability; Deterministic Test Pattern Sequences; Field-Programmable Gate-Arrays (FPGAs); Self-Test; Sequential Circuits (xsd:string)
dc:title Self-test of sequential circuits with deterministic test pattern sequences. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)