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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/LeS98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kim_T._Le>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008389217344>
foaf:homepage <https://doi.org/10.1023/A:1008389217344>
dc:identifier DBLP journals/et/LeS98 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008389217344 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Heuristic Measure to Maximize Detected Faults per Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kim_T._Le>
swrc:number 1 (xsd:string)
swrc:pages 57-60 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/LeS98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/LeS98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et13.html#LeS98>
rdfs:seeAlso <https://doi.org/10.1023/A:1008389217344>
dc:subject backtrace; combinational circuit testing; dynamic test compaction; fault selection; test generation; testability measures (xsd:string)
dc:title A Heuristic Measure to Maximize Detected Faults per Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)