[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/LeeH02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1020853107381>
foaf:homepage <https://doi.org/10.1023/A:1020853107381>
dc:identifier DBLP journals/et/LeeH02 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1020853107381 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Chu_Huang>
swrc:number 6 (xsd:string)
swrc:pages 627-636 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/LeeH02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/LeeH02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et18.html#LeeH02>
rdfs:seeAlso <https://doi.org/10.1023/A:1020853107381>
dc:subject multiple scan chains; interleaving scan; test power reduction; peak power reduction (xsd:string)
dc:title An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)