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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/LiTW02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruey-Shing_Tzeng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1016557927479>
foaf:homepage <https://doi.org/10.1023/A:1016557927479>
dc:identifier DBLP journals/et/LiTW02 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1016557927479 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruey-Shing_Tzeng>
swrc:number 4-5 (xsd:string)
swrc:pages 515-527 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/LiTW02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/LiTW02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et18.html#LiTW02>
rdfs:seeAlso <https://doi.org/10.1023/A:1016557927479>
dc:subject built-in self-test (BIST); data compression; Hamming syndrome; Huffman code; March test; memory diagnostics; memory testing; system-on-chip (xsd:string)
dc:title Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)