Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/LinH06
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/LinH06
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang
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dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yu-Chiun_Lin
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-7143-8
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DBLP journals/et/LinH06
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2006
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rdfs:
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Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults.
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https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang
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foaf:
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https://dblp.l3s.de/d2r/resource/authors/Yu-Chiun_Lin
>
swrc:
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2
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swrc:
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151-159
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https://doi.org/10.1007/s10836-006-7143-8
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dc:
subject
fault diagnosis; multiple fault diagnosis; yield; debugging; prime candidate
(xsd:string)
dc:
title
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults.
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22
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