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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/LiuMK00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ayman_I._Kayssi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008324900917>
foaf:homepage <https://doi.org/10.1023/A:1008324900917>
dc:identifier DBLP journals/et/LiuMK00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008324900917 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Dynamic Power Supply Current Testing of CMOS SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ayman_I._Kayssi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
swrc:number 5 (xsd:string)
swrc:pages 499-511 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/LiuMK00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/LiuMK00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#LiuMK00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008324900917>
dc:subject transient power supply current (i DDT); transient current sensor; disturb fault; CMOS SRAM (xsd:string)
dc:title Dynamic Power Supply Current Testing of CMOS SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)