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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/LiuNUS08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lushan_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pradeep_Nagaraj>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ramalingam_Sridhar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shambhu_J._Upadhyaya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5023-5>
foaf:homepage <https://doi.org/10.1007/s10836-007-5023-5>
dc:identifier DBLP journals/et/LiuNUS08 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5023-5 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lushan_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pradeep_Nagaraj>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ramalingam_Sridhar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shambhu_J._Upadhyaya>
swrc:number 1-3 (xsd:string)
swrc:pages 165-179 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/LiuNUS08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/LiuNUS08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et24.html#LiuNUS08>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5023-5>
dc:subject Multi-port SRAMs; Defect analysis; Defect/fault tolerant design (xsd:string)
dc:title Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)