Embedded System Level Self-Test for Mixed-Signal IO Verification. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/et/Loukusa06>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/V._Loukusa>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-9458-x>
foaf:homepage	<https://doi.org/10.1007/s10836-006-9458-x>
dc:identifier	DBLP journals/et/Loukusa06 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2Fs10836-006-9458-x (xsd:string)
dcterms:issued	2006 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label	Embedded System Level Self-Test for Mixed-Signal IO Verification. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/V._Loukusa>
swrc:number	4-6 (xsd:string)
swrc:pages	463-470 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/et/Loukusa06/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/et/Loukusa06>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/et/et22.html#Loukusa06>
rdfs:seeAlso	<https://doi.org/10.1007/s10836-006-9458-x>
dc:subject	self-test; system level; DFT; testability; IO connectivity; mixed-signal; histogram (xsd:string)
dc:title	Embedded System Level Self-Test for Mixed-Signal IO Verification. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	22 (xsd:string)