A Novel Built-In Self-Repair Approach for Embedded RAMs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/Lu03
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/Lu03
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Shyue-Kung_Lu
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homepage
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http://dx.doi.org/doi.org%2F10.1023%2FA%3A1023757332085
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DBLP journals/et/Lu03
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DOI doi.org%2F10.1023%2FA%3A1023757332085
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dcterms:
issued
2003
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swrc:
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rdfs:
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A Novel Built-In Self-Repair Approach for Embedded RAMs.
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https://dblp.l3s.de/d2r/resource/authors/Shyue-Kung_Lu
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swrc:
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3
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swrc:
pages
315-324
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dc:
subject
divided word line; embedded memory; fault tolerance; low power design; redundancy
(xsd:string)
dc:
title
A Novel Built-In Self-Repair Approach for Embedded RAMs.
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19
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