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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/LuLSC02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chauchin_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Wen_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu-E_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1013784124552>
foaf:homepage <https://doi.org/10.1023/A:1013784124552>
dc:identifier DBLP journals/et/LuLSC02 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1013784124552 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chauchin_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Wen_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu-E_Chen>
swrc:number 1 (xsd:string)
swrc:pages 89-97 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/LuLSC02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/LuLSC02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et18.html#LuLSC02>
rdfs:seeAlso <https://doi.org/10.1023/A:1013784124552>
dc:subject IDDQ testing; deep sub-micron; VLSI (xsd:string)
dc:title Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)