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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/MaS99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wanchun_Shi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuhai_Ma>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008318421537>
foaf:homepage <https://doi.org/10.1023/A:1008318421537>
dc:identifier DBLP journals/et/MaS99 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008318421537 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wanchun_Shi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuhai_Ma>
swrc:number 3 (xsd:string)
swrc:pages 273-293 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/MaS99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/MaS99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et14.html#MaS99>
rdfs:seeAlso <https://doi.org/10.1023/A:1008318421537>
dc:subject test program; error type; off-line debugging environment; fuzzy set; FCE (Fuzzy Comprehensive Evaluation); reference set; evaluation space; evaluation factor; evaluation remark; fuzzy relation; test entity; relevance coefficient (xsd:string)
dc:title Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)