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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/MaSRBD07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Corn%E2%88%9A%C2%A9_Bastiaansen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Geert_Seuren>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Ma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leon_van_der_Dussen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Van_Rijsinge>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5011-9>
foaf:homepage <https://doi.org/10.1007/s10836-007-5011-9>
dc:identifier DBLP journals/et/MaSRBD07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5011-9 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Design-Based Structural Test Method for a Switched-Resistor DAC. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Corn%E2%88%9A%C2%A9_Bastiaansen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Geert_Seuren>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Ma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leon_van_der_Dussen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Van_Rijsinge>
swrc:number 6 (xsd:string)
swrc:pages 559-567 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/MaSRBD07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/MaSRBD07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et23.html#MaSRBD07>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5011-9>
dc:subject Switched-resistor DAC; Design-based structural test; Static test; THD; Test time reduction (xsd:string)
dc:title A Design-Based Structural Test Method for a Switched-Resistor DAC. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)