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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/Marinissen02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1016545607915>
foaf:homepage <https://doi.org/10.1023/A:1016545607915>
dc:identifier DBLP journals/et/Marinissen02 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1016545607915 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erik_Jan_Marinissen>
swrc:number 4-5 (xsd:string)
swrc:pages 435-454 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/Marinissen02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/Marinissen02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et18.html#Marinissen02>
rdfs:seeAlso <https://doi.org/10.1023/A:1016545607915>
dc:subject system chips; embedded cores; test generation; test protocol; expansion; test protocol scheduling (xsd:string)
dc:title The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)