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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/MirCC00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Beno%E2%88%9A%C4%A3t_Charlot>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Salvador_Mir>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008303717862>
foaf:homepage <https://doi.org/10.1023/A:1008303717862>
dc:identifier DBLP journals/et/MirCC00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008303717862 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Extending Fault-Based Testing to Microelectromechanical Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Beno%E2%88%9A%C4%A3t_Charlot>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Salvador_Mir>
swrc:number 3 (xsd:string)
swrc:pages 279-288 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/MirCC00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/MirCC00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#MirCC00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008303717862>
dc:subject MEMS; defects; failure modes; fault modeling; HDLs; fault simulation; nodal simulation (xsd:string)
dc:title Extending Fault-Based Testing to Microelectromechanical Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)