Unified built-in self-test for fully differential analog circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/MirLC96a
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1996
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Unified built-in self-test for fully differential analog circuits.
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135-151
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on-line/off-line analog test; analog BIST; unified BIST; fully differential analog circuits; common-mode feedback
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Unified built-in self-test for fully differential analog circuits.
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