Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case Study.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/Miura06
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/Miura06
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yukiya_Miura
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-9456-z
>
foaf:
homepage
<
https://doi.org/10.1007/s10836-006-9456-z
>
dc:
identifier
DBLP journals/et/Miura06
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2Fs10836-006-9456-z
(xsd:string)
dcterms:
issued
2006
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case Study.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yukiya_Miura
>
swrc:
number
4-6
(xsd:string)
swrc:
pages
411-423
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/Miura06/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/Miura06
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et22.html#Miura06
>
rdfs:
seeAlso
<
https://doi.org/10.1007/s10836-006-9456-z
>
dc:
subject
analog circuits; fault diagnosis; MOS transistors; operation-region model; X-Y zoning method
(xsd:string)
dc:
title
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case Study.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
22
(xsd:string)