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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/MukherjeeB98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Debaditya_Mukherjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Melvin_A._Breuer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008385819898>
foaf:homepage <https://doi.org/10.1023/A:1008385819898>
dc:identifier DBLP journals/et/MukherjeeB98 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008385819898 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label An IEEE 1149.1 Compliant Test Control Architecture. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Debaditya_Mukherjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Melvin_A._Breuer>
swrc:number 3 (xsd:string)
swrc:pages 273-297 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/MukherjeeB98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/MukherjeeB98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et13.html#MukherjeeB98>
rdfs:seeAlso <https://doi.org/10.1023/A:1008385819898>
dc:subject test control; boundary scan; built-in self-test; design-for-test; test bus; local test control; distributed test control; dynamic test control (xsd:string)
dc:title An IEEE 1149.1 Compliant Test Control Architecture. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)