Multichip Module Diagnosis by Product-Code Signatures.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/NagvajaraLNW97
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Value
dcterms:
bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/et/NagvajaraLNW97
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https://dblp.l3s.de/d2r/resource/authors/C._Wang
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https://dblp.l3s.de/d2r/resource/authors/J._Lin
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dc:
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https://dblp.l3s.de/d2r/resource/authors/P._Nilagupta
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Prawat_Nagvajara
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http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008234917747
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DBLP journals/et/NagvajaraLNW97
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DOI doi.org%2F10.1023%2FA%3A1008234917747
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dcterms:
issued
1997
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journal
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https://dblp.l3s.de/d2r/resource/journals/et
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rdfs:
label
Multichip Module Diagnosis by Product-Code Signatures.
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foaf:
maker
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https://dblp.l3s.de/d2r/resource/authors/C._Wang
>
foaf:
maker
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foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/P._Nilagupta
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foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Prawat_Nagvajara
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swrc:
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1-2
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swrc:
pages
127-136
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owl:
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dc:
subject
Multichip Module test and diagnosis; system diagnosis; built-in self-test; signature analysis
(xsd:string)
dc:
title
Multichip Module Diagnosis by Product-Code Signatures.
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