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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/NicolaidisZ98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yervant_Zorian>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008244815697>
foaf:homepage <https://doi.org/10.1023/A:1008244815697>
dc:identifier DBLP journals/et/NicolaidisZ98 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008244815697 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label On-Line Testing for VLSI - A Compendium of Approaches. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yervant_Zorian>
swrc:number 1-2 (xsd:string)
swrc:pages 7-20 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/NicolaidisZ98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/NicolaidisZ98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et12.html#NicolaidisZ98>
rdfs:seeAlso <https://doi.org/10.1023/A:1008244815697>
dc:subject on-line testing; self-checking circuits; fail-safe circuits; SEU hardened circuits; monitoring of reliability indicators; current monitors; thermal monitors; radiation monitors (xsd:string)
dc:title On-Line Testing for VLSI - A Compendium of Approaches. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)