[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/OhtakeMF00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Ohtake>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshimitsu_Masuzawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008333102734>
foaf:homepage <https://doi.org/10.1023/A:1008333102734>
dc:identifier DBLP journals/et/OhtakeMF00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008333102734 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideo_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Ohtake>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshimitsu_Masuzawa>
swrc:number 5 (xsd:string)
swrc:pages 553-566 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/OhtakeMF00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/OhtakeMF00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#OhtakeMF00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008333102734>
dc:subject non-scan design for testability; complete fault efficiency; controllers; at-speed test (xsd:string)
dc:title A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)