On-Line Fault Resilience Through Gracefully Degradable ASICs. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/et/Orailoglu98>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Alex_Orailoglu>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008298226600>
foaf:homepage	<https://doi.org/10.1023/A:1008298226600>
dc:identifier	DBLP journals/et/Orailoglu98 (xsd:string)
dc:identifier	DOI doi.org%2F10.1023%2FA%3A1008298226600 (xsd:string)
dcterms:issued	1998 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label	On-Line Fault Resilience Through Gracefully Degradable ASICs. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Alex_Orailoglu>
swrc:number	1-2 (xsd:string)
swrc:pages	145-151 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/et/Orailoglu98/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/et/Orailoglu98>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/et/et12.html#Orailoglu98>
rdfs:seeAlso	<https://doi.org/10.1023/A:1008298226600>
dc:subject	on-line test; high level synthesis; fault tolerant ICs; graceful degradation; reconfigurable ASICs (xsd:string)
dc:title	On-Line Fault Resilience Through Gracefully Degradable ASICs. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	12 (xsd:string)