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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PahlevanzadehY14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hoda_Pahlevanzadeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiaoyan_Yu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-014-5476-2>
foaf:homepage <https://doi.org/10.1007/s10836-014-5476-2>
dc:identifier DBLP journals/et/PahlevanzadehY14 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-014-5476-2 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hoda_Pahlevanzadeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiaoyan_Yu>
swrc:number 5 (xsd:string)
swrc:pages 595-609 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PahlevanzadehY14/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PahlevanzadehY14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et30.html#PahlevanzadehY14>
rdfs:seeAlso <https://doi.org/10.1007/s10836-014-5476-2>
dc:title A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)