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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PalchaudhuriD19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anindya_Sundar_Dhar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ayan_Palchaudhuri>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-019-05840-w>
foaf:homepage <https://doi.org/10.1007/s10836-019-05840-w>
dc:identifier DBLP journals/et/PalchaudhuriD19 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-019-05840-w (xsd:string)
dcterms:issued 2019 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anindya_Sundar_Dhar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ayan_Palchaudhuri>
swrc:number 6 (xsd:string)
swrc:pages 779-796 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PalchaudhuriD19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PalchaudhuriD19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et35.html#PalchaudhuriD19>
rdfs:seeAlso <https://doi.org/10.1007/s10836-019-05840-w>
dc:title Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 35 (xsd:string)