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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PappuBAM98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lakshminarayana_Pappu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mandyam-Komar_Srinivas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008228817698>
foaf:homepage <https://doi.org/10.1023/A:1008228817698>
dc:identifier DBLP journals/et/PappuBAM98 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008228817698 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lakshminarayana_Pappu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mandyam-Komar_Srinivas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:number 3 (xsd:string)
swrc:pages 239-254 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PappuBAM98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PappuBAM98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et12.html#PappuBAM98>
rdfs:seeAlso <https://doi.org/10.1023/A:1008228817698>
dc:subject delay test; fault simulation; path-delay faults; transition faults; statistical fault analysis (xsd:string)
dc:title Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)