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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PatelSP05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhishek_Singh_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chintan_Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jim_Plusquellic>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-005-2783-7>
foaf:homepage <https://doi.org/10.1007/s10836-005-2783-7>
dc:identifier DBLP journals/et/PatelSP05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-005-2783-7 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Defect Detection Using Quiescent Signal Analysis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhishek_Singh_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chintan_Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jim_Plusquellic>
swrc:number 5 (xsd:string)
swrc:pages 463-483 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PatelSP05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PatelSP05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et21.html#PatelSP05>
rdfs:seeAlso <https://doi.org/10.1007/s10836-005-2783-7>
dc:subject defect-based testing; IDDQ; current testing; parametric testing; multiple current measurements; Quiescent Signal Analysis (xsd:string)
dc:title Defect Detection Using Quiescent Signal Analysis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 21 (xsd:string)