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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PaulR06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bipul_C._Paul>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-7427-z>
foaf:homepage <https://doi.org/10.1007/s10836-006-7427-z>
dc:identifier DBLP journals/et/PaulR06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-7427-z (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bipul_C._Paul>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
swrc:number 2 (xsd:string)
swrc:pages 115-124 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PaulR06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PaulR06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et22.html#PaulR06>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-7427-z>
dc:subject delay fault testing; adaptive body bias design; process variation; statistical analysis (xsd:string)
dc:title Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)