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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PicosRISG00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eugeni_Isern_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eugenio_Garc%E2%88%9A%E2%89%A0a-Moreno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miquel_Roca_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rodrigo_Picos>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008339315137>
foaf:homepage <https://doi.org/10.1023/A:1008339315137>
dc:identifier DBLP journals/et/PicosRISG00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008339315137 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Experimental Results on BIC Sensors for Transient Current Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eugeni_Isern_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eugenio_Garc%E2%88%9A%E2%89%A0a-Moreno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miquel_Roca_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rodrigo_Picos>
swrc:number 3 (xsd:string)
swrc:pages 235-241 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PicosRISG00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PicosRISG00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#PicosRISG00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008339315137>
dc:subject transient current testing; i(t); built-in current sensor; defect detection (xsd:string)
dc:title Experimental Results on BIC Sensors for Transient Current Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)