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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PomeranzR00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008385125818>
foaf:homepage <https://doi.org/10.1023/A:1008385125818>
dc:identifier DBLP journals/et/PomeranzR00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008385125818 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Static Test Compaction for Scan-Based Designs to Reduce Test Application Time. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:number 5 (xsd:string)
swrc:pages 541-552 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PomeranzR00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PomeranzR00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#PomeranzR00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008385125818>
dc:subject scan circuits; static test compaction; test application time (xsd:string)
dc:title Static Test Compaction for Scan-Based Designs to Reduce Test Application Time. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)