[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/PortalAN05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Didier_N%E2%88%9A%C2%A9e>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Michel_Portal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-005-5285-8>
foaf:homepage <https://doi.org/10.1007/s10836-005-5285-8>
dc:identifier DBLP journals/et/PortalAN05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-005-5285-8 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Didier_N%E2%88%9A%C2%A9e>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Michel_Portal>
swrc:number 1 (xsd:string)
swrc:pages 33-42 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/PortalAN05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/PortalAN05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et21.html#PortalAN05>
rdfs:seeAlso <https://doi.org/10.1007/s10836-005-5285-8>
dc:subject non-volatile memory; EEPROM; memory testing; diagnosis (xsd:string)
dc:title EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 21 (xsd:string)