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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/Posse97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Posse>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008282800908>
foaf:homepage <https://doi.org/10.1023/A:1008282800908>
dc:identifier DBLP journals/et/Posse97 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008282800908 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Posse>
swrc:number 1-2 (xsd:string)
swrc:pages 119-125 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/Posse97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/Posse97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et10.html#Posse97>
rdfs:seeAlso <https://doi.org/10.1023/A:1008282800908>
dc:subject Boundary-Scan; Multichip Module; MCM; interconnect testing; manufacturing defects; fault diagnosis (xsd:string)
dc:title A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 10 (xsd:string)