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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/RenczSTTC00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kholdoun_Torki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%B0rta_Rencz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._T%E2%88%9A%E2%88%82r%E2%88%9A%E2%88%82k>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vladim%E2%88%9A%E2%89%A0r_Sz%E2%88%9A%C2%A9kely>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008364515030>
foaf:homepage <https://doi.org/10.1023/A:1008364515030>
dc:identifier DBLP journals/et/RenczSTTC00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008364515030 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label IDDQ Testing of Submicron CMOS - by Cooling? (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernard_Courtois>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kholdoun_Torki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%B0rta_Rencz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._T%E2%88%9A%E2%88%82r%E2%88%9A%E2%88%82k>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vladim%E2%88%9A%E2%89%A0r_Sz%E2%88%9A%C2%A9kely>
swrc:number 5 (xsd:string)
swrc:pages 453-461 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/RenczSTTC00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/RenczSTTC00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#RenczSTTC00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008364515030>
dc:subject I DDQ testing; submicron; cooling (xsd:string)
dc:title IDDQ Testing of Submicron CMOS - by Cooling? (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)