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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ReppenA91>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bj%E2%88%9A%C5%82rg_Reppen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Einar_J._Aas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00135439>
foaf:homepage <https://doi.org/10.1007/BF00135439>
dc:identifier DBLP journals/et/ReppenA91 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00135439 (xsd:string)
dcterms:issued 1991 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Combined probabilistic testability calculation and compact test generation for PLAs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bj%E2%88%9A%C5%82rg_Reppen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Einar_J._Aas>
swrc:number 3 (xsd:string)
swrc:pages 215-227 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ReppenA91/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ReppenA91>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et2.html#ReppenA91>
rdfs:seeAlso <https://doi.org/10.1007/BF00135439>
dc:subject Fault coverage; probabilistic testability; programmable logic arrays; test pattern generation (xsd:string)
dc:title Combined probabilistic testability calculation and compact test generation for PLAs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 2 (xsd:string)