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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/RiusF92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josep_Rius_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00135342>
foaf:homepage <https://doi.org/10.1007/BF00135342>
dc:identifier DBLP journals/et/RiusF92 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00135342 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Proportional BIC sensor for current testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josep_Rius_0001>
swrc:number 4 (xsd:string)
swrc:pages 387-396 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/RiusF92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/RiusF92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et3.html#RiusF92>
rdfs:seeAlso <https://doi.org/10.1007/BF00135342>
dc:subject Built-in integrated sensor; CMOS lateral BJT; current test; gate controlled BJT; I DDQ measure (xsd:string)
dc:title Proportional BIC sensor for current testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 3 (xsd:string)