Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/RiusF96
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DBLP journals/et/RiusF96
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1996
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Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments.
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current testing; I DDQ testability; Built-in Current Sensors
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Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments.
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